Influence of the SEI Formation on the Stability and Lithium Diffusion in Si Electrodes

Wu, Baolin; Chen, Chunguang (Corresponding author); Danilov, Dmitri L.; Jiang, Ming; Raijmakers, Luc H. J.; Eichel, Rüdiger-A.; Notten, Peter H. L. (Corresponding author)

Washington, DC : ACS Publications (2022)
Journal Article

In: ACS omega
Volume: 7
Issue: 36
Page(s)/Article-Nr.: 32740-32748

Identifier