On the conversion of NDP energy spectra into depth concentration profiles for thin-films all-solid-state batteries

Danilov, D. L. (Corresponding author); Chen, C.; Jiang, M.; Eichel, Rüdiger-A.; Notten, P. H. L.

London [u.a.] : Taylor & Francis (2020)
Fachzeitschriftenartikel

In: Radiation effects and defects in solids
Band: 175
Heft: 3/4
Seite(n)/Artikel-Nr.: 367-382