Probing vacancy behavior across complex oxide heterointerfaces

Zhu, Jiaxin; Lee, Jung-Woo; Lee, Hyungwoo; Xie, Lin; Pan, Xiaoqing; De Souza, Roger A.; Eom, Chang-Beom; Nonnenmann, Stephen S. (Corresponding author)

Washington, DC [u.a.] : American Association for the Advancement of Science (2019)
Journal Article

In: Science advances
Volume: 5
Issue: 2
Page(s)/Article-Nr.: eaau8467

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