Quantitative Determination of Native Point‐Defect Concentrations at the ppm Level in Un‐Doped BaSnO$_{3}$ Thin Films

Belthle, Kendra Solveig; Gries, Ute; Müller, Michael Patrick; Kemp, Dennis; Prakash, Abhinav; Rose, Marc-André; Börgers, Jacqueline M.; Jalan, Bharat; Gunkel, Felix; De Souza, Roger (Corresponding author)

Weinheim : Wiley-VCH (2022)
Journal Article

In: Advanced functional materials
Volume: 32
Issue: 19
Page(s)/Article-Nr.: 2113023

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