Quantitative Determination of Native Point‐Defect Concentrations at the ppm Level in Un‐Doped BaSnO$_{3}$ Thin Films

Belthle, Kendra Solveig; Gries, Ute; Müller, Michael Patrick; Kemp, Dennis; Prakash, Abhinav; Rose, Marc-André; Börgers, Jacqueline M.; Jalan, Bharat; Gunkel, Felix; De Souza, Roger (Corresponding author)

Weinheim : Wiley-VCH (2022)
Fachzeitschriftenartikel

In: Advanced functional materials
Band: 32
Heft: 19
Seite(n)/Artikel-Nr.: 2113023